Watch this video to discover how you can leverage Intraratio's RunCard MES for its advanced reporting capabilities for  optimizing efficiency and quality.

In today’s fast-paced manufacturing landscape, real-time data and actionable insights are essential for optimizing efficiency and quality. Intraratio's RunCard MES includes built-in reporting suite that empowers every level of your organization, from executives tracking factory performance to engineers analyzing yield metrics at the serial level.

With powerful customization, intuitive filtering, and dynamic visualization, RunCard transforms raw data into valuable intelligence.

Precision Reporting for Every Role

RunCard’s reporting tools feature flexible filtering, allowing users to drill down into specific parameters like factory lines, part classes, work orders, and custom time ranges. Whether you need an hourly snapshot or long-term trends, RunCard adapts to your needs, ensuring seamless access to critical insights for decision-makers and technical teams alike.

Yield Analysis: Identifying Trends & Bottlenecks

Optimizing production hinges on a deep understanding of yield trends. RunCard's Product Yield Reports empower manufacturers to pinpoint variations across different products and group data by factory or production line. This provides a holistic view of operational performance, enabling easy identification of both high-performing and underperforming areas. For a more granular analysis, a detailed tabular view offers deeper insights into specific processes.

For a more granular approach, Operation Yield Reports allow filtering by work orders and opcodes, helping users analyze step-by-step performance. Rolling yield analysis offers a real-time look at how yields evolve through each stage, revealing potential bottlenecks and inefficiencies before they escalate.

First-Pass vs. Final-Pass Yield: Minimizing Rework

RunCard’s First vs. Final Pass analysis highlights discrepancies between initial and final yields on an hourly basis, giving manufacturers visibility into high rework rates and potential quality issues. This proactive approach ensures that defects are caught early, reducing production delays and costs.

Defect Analysis: From Pareto to Sunburst Charts

RunCard makes defect tracking and root cause analysis effortless with intuitive visual tools. The Defect Pareto Analysis offers an adjustable slider to zoom in on critical defects, while selecting a row instantly reveals all affected serial numbers—helping teams quickly isolate problematic batches.

The Defect Sunburst Chart takes this further by offering a hierarchical breakdown of defect data, from the factory level down to specific machines, part numbers, and defect codes. This allows manufacturers to identify recurring issues, whether caused by a faulty machine, inconsistent material quality, or process inefficiencies. Dynamic trend charts update in real time, ensuring engineers can spot trends and take corrective action before defects impact production.

Turning Insights into Action

With RunCard, data is more than just numbers—it’s a roadmap to operational excellence. By integrating yield tracking, defect analysis, and automated reporting, manufacturers gain a powerful toolset for minimizing downtime, improving quality, and maximizing efficiency. Request your demo today here!

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